@string{WMCS = {Department of Computer Science, College of William and Mary}}
@string{WMCS_addr = {Williamsburg, VA  23185}}

@string{BADISCHE = {Badische Corporation (BASF)}}
@string{BADISCHE_addr = {Williamsburg, VA 23185}}

@string{IBM = {IBM Corporation}}
@string{IBM_addr = {Poughkeepsie, New York 12602}}

@string{ACADEMIC = {Academic Press}}
@string{ACADEMIC_addr = {Orlando, FL}}

@string{AW = {Addison-Wesley}}
@string{AW_addr = {Reading, MA}}

@string{CAMBRIDGE = {Cambridge University Press}}
@string{CAMBRIDGE_addr = {New York, NY}}

@string{CSP = {Computer Science Press}}
@string{CSP_addr = {Rockville, MD}}

@string{DOVER = {Dover}}
@string{DOVER_addr = {New York, NY}}

@string{DOWDEN = {Dowden, Hutchinson, and Ross}}
@string{DOWDEN_addr = {Stroudsburg, PA}}

@string{FREEMAN = {W. H. Freeman}}
@string{FREEMAN_addr = {New York, NY}}

@string{GATS = {G \& A Technical Software}}
@string{GATS_addr = {Hampton, VA}}

@string{IEEE = {IEEE}}
@string{IEEE_addr = {New York, NY}}

@string{IEEECS = {IEEE Computer Society}}
@string{IEEECS_addr = {Silver Spring, MD}}

@string{KLUWER = {Kluwer Academic Publishers}}
@string{KLUWER_addr = {Boston, MA}}

@string{MACMILLAN = {Macmillan}}
@string{MACMILLAN_addr = {New York, NY}}

@string{MCGRAW = {McGraw-Hill}}
@string{MCGRAW_addr = {New York, NY}}

@string{MIT = {MIT Press}}
@string{MIT_addr = {Cambridge, MA}}

@string{NASA = {NASA}}
@string{NASA_addr = {Washington, DC}}

@string{OXFORD = {Oxford University Press}}
@string{OXFORD_addr = {New York, NY}}

@string{PH = {Prentice-Hall}}
@string{PH_addr = {Englewood Cliffs, NJ}}

@string{PLENUM = {Plenum Press}}
@string{PLENUM_addr = {New York, NY}}

@string{PWS = {Prindle, Weber & Schmidt}}
@string{PWS_addr = {Boston, MA}}

@string{REIDEL = {D. Reidel Publishing}}
@string{REIDEL_addr = {}}

@string{SPRINGER = {Springer-Verlag}}
@string{SPRINGER_addr = {New York, NY}}

@string{ILL = {University of Illinois Press}}
@string{ILL_addr = {Urbana, IL}}

@string{VNR = {Van Nostrand Reinhold}}
@string{VNR_addr = {New York, NY}}

@string{WILEY = {John Wiley and Sons}}
@string{WILEY_addr = {New York, NY}}

@string{AJOPO = {American Journal of Optometry and Physiological Optics}}

@string{AO = {Applied Optics}}

@string{BYTE = {Byte}}

@string{CVGIP = {Computer Vision, Graphics, and Image Processing}}

@string{ELECTLETTERS = {Electronics Letters}}

@string{COMP = {Computer}}
@string{CACM = {Communications of the ACM}}
@string{SPECTRUM = {IEEE Spectrum}}
@string{PIEEE = {Proceedings of the IEEE}}
@string{IEEEASSP = {IEEE Transactions on Acoustics, Speech, and Signal
	Processing}}
@string{IEEEAES = {IEEE Transactions on Aerospace and Electronic Systems}}
@string{IEEEAC = {IEEE Transactions on Automatic Control}}
@string{IEEEAU = {IEEE Transactions on Audio and Electroacoustics}}
@string{IEEEBR = {IEEE Transactions on Biomedical Engineering}}
@string{IEEEC = {IEEE Transactions on Computers}}
@string{IEEECAS = {IEEE Transactions on Circuits and Systems}}
@string{IEEECOM = {IEEE Transactions on Communication}}
@string{IEEEIT = {IEEE Transactions on Information Theory}}
@string{IEEEPAMI = {IEEE Transactions on Pattern Analysis and Machine
	Intelligence}}
@string{IEEESMC = {IEEE Transactions on Systems, Man, and Cybernetics}}

@string{IVC = {Image and Vision Computing}}

@string{IJRS = {International Journal of Remote Sensing}}

@string{PIRE = {Proceedings of the IRE}}

@string{INF_CNTRL = {Information and Control}}

@string{JACM = {Journal of the Association for Computing Machinery}}

@string{JIT = {Journal of Imaging Technology}}

@string{JOSA = {Journal of the Optical Society of America}}
@string{JOSAA = {Journal of the Optical Society of America A}}
@string{JOSAB = {Journal of the Optical Society of America B}}

@string{JRNBS = {Journal of Research of the National Bureau of Standards}}

@string{JSOUNDVIB = {J. Sound Vib.}}

@string{MATHCOMP = {Mathematics of Computation}}

@string{OPTENGR = {Optical Engineering}}

@string{OPTICSCOMM = {Optics Communications}}

@string{PATTERNREC = {Pattern Recognition}}

@string{PHOTOGRAM = {Photogrammetria}}

@string{PHOTOSCIENGR = {Photographic Science and Engineering}}

@string{REVSCIINSTR = {Rev. Sci. Instrum.}}

@string{SCIENCE = {Science}}

@string{SIAMAPPLMATH = {SIAM Journal of Applied Mathematics}}
@string{SIAMSCISTATCOMP = {SIAM Journal of Scientific and Statistical
		Computing}}

@string{CCVPR = {Proceedings of the Conference on
	Computer Vision and Pattern Recognition}}

@string{ICASSP = {Proceedings of the International Conference on
	Acoustics, Speech, and Signal Processing}}

@string{PROC_ISCAS = {Proceedings of the International Symposium on Circuits
	and Systems}}

@string{PROC_PRINCETON_CISS = {Proceedings of the Princeton Conference on
	Information Sciences and Systems}}

@string{PROC_PRIP = {Proceedings of the Conference on Pattern Recognition
	and Image Processing}}

@string{PROC_SPIE = {Proceedings of the Society of Photo-Optical
	Instrumentation Engineers}}

@string{VIPTT = {Visual Information Processing for Television an
                 Telerobotics}}


@ARTICLE{park:ao21/8,
        AUTHOR = "Park, Jae H.",
        TITLE  = "Effect of Interferogram Smearing on Atmospheric Limb Sounding
                  by Fourier Transform Spectroscopy",
        JOURNAL= AO,
        VOLUME = "21",
        NUMBER = "8",
        PAGES  = "1356--1366",
        YEAR   = 1982
}
@ARTICLE{norton+beers:josa66/3,
        AUTHOR = "Norton, Robert H. and Beer, Reinhard",
        TITLE  = "New Apodizing Functions for Fourier Spectrometry",
        JOURNAL= JOSA,
        VOLUME = "66",
        NUMBER = "3",
        PAGES  = "259--264",
        YEAR   = 1976
}


@INCOLLECTION{bertie,
        AUTHOR    = "Bertie, John E.",
	EDITOR    = "Durig, J. R.",
	BOOKTITLE = "Analytical Applications of FT-IR to Molecular 
                     and Biological Systems",
	TITLE     = "Apodization and Phase Correction",
	PUBLISHER = REIDEL,
	PAGES     = "25--50",
	YEAR      = 1980
}

@INPROCEEDINGS{park:spie1992,
	AUTHOR = "Park, Stephen K.",
	TITLE = "Image Gathering, Interpolation and Restoration: A Fidelity Analysis",
	BOOKTITLE = "SPIE 1992 Technical Symposium on
                     Visual Information Processing",
 	PEDITOR = "",
	ORGANIZATION = SPIE,
	VOLUME = "",
	PAGES = "",
	YEAR = 1992,
	ABSTRACT = "Many modeling, simulation and performance analysis studies of
                    sampled imaging systems are inherently incomplete because the
                    are conditioned on a discrete-input, discrete-output model
                    which only accounts for blurring during image gathering and 
                    additive noise. For those sampled imaging systems where the
                    effects of image gathering, restoration and interpolation
                    are significant the modeling, simulation and performance
                    analysis shoudl be based on a more comprehensive continuous-input,
                    discrete processing, continuous-output end-to-end model. This
                    more comprehensive model should properly account for the low-pass
                    filtering effects of image gathering prior to sampling, the
                    potentially important noise-like effects of aliasing, additive
                    noise, the high-pass filtering effects of restoration, and
                    the low-pass filtering effects of image reconstruction. Yet
                    this model should not be so complex as to preclude significant
                    mathematical analysis, particularly the mean-squared (fidelity)
                    type of analysis so common in linear system theory. In this
                    paper we demonstrate that, although the mathematics of this
                    more comprehensive model is more complex, the increase in 
                    complexity is not so great as to prevent a complete fidelity-metric
                    analysis at both the component level and at the end-to-end
                    system level. That is, easily computed, mean-square-based
                    fidelity metrics are developed by which both component-level
                    and system-level performance can be predicted. In particular,
                    it is demostrated that these fidelity metrics can be used to
                    quantify the combined effects of image gathering, restoration
                    and reconstruction."
                    
}


@INPROCEEDINGS{reichenbach++:spie1569,
	AUTHOR = "Reichenbach, Stephen E. and Park, Stephen K. and
                  Alter-Gartenberg, Rachel and Rahman, Zia-ur",
	TITLE = "Artificial Scenes and Simulated Imaging",
	BOOKTITLE = "Stochastic and Neural Methods in Signal Processing,
                     Image Processing, and Computer Vision",
 	PEDITOR = "Su-Shing Chen",
	ORGANIZATION = SPIE,
	VOLUME = "1569",
	PAGES = "422--433",
	YEAR = 1991,
	ABSTRACT = "This paper describes a software simulation environment
                    for controlled image processing research. The simulation is
                    based on a comprehensive model of the end-to-end imaging
                    process that accounts ofr statistical characteristics of the
                    scene, image formation, noise, noise and display reconstruction.
                    The simulation uses a stochastic process to generate superresolution
                    digital scenes with variable spatial structure and detail.
                    The simulation of the imaging process accounts for the important
                    components of digital imaging systems, including the transformation
                    from continuous to discrete acquisition and from discrete
                    to continuous during display. This model is appropriate for 
                    a variety of problems that involve image acquisition and
                    display including system design, image restoration, enhancement,
                    compression, and edge detection. By using a model-based simulation
                    research can be conducted with greater precision, flexibility, 
                    and portability than is possible using physical systems and
                    experiments can be replicated on any general purpose computer."

}


@ARTICLE{burton++:jit17/6,
        AUTHOR = "Burton, John C. and Miller, Keith W. and Park, Stephen K.",
        TITLE  = "Fidelity Metrics for Hexagonally Sampled Digital Imaging Systems",
        JOURNAL= JIT,
        VOLUME = "17",
        NUMBER = "6",
        PAGES  = "279--283",
        YEAR   = 1991
}


@TECHREPORT{ibm:nicref,
	AUTHOR = "Bell, Ron",
	TITLE = "{IBM} {RISC} {S}ystem/6000 {NIC} Tuning GUide for {FORTRAN} and {C}",
	INSTITUTION = IBM,
	ADDRESS = IBM_addr,
	NUMBER = "GG24-3611-01",
	MONTH = "July",
	YEAR = 1991,
	ABSTRACT = "TO BE TYPED"
}

@TECHREPORT{s3user,
	AUTHOR = "Burton, John  and Gordley, Larry",
	TITLE = "S3 Users Guide",
	INSTITUTION = GATS,
	ADDRESS = GATS_addr,
	MONTH = "July",
	YEAR = 1992,
	ABSTRACT = "TO BE TYPED"
}

@TECHREPORT{s3ref,
	AUTHOR = "Burton, John and Gordley, Larry",
	TITLE = "S3 Reference Manual",
	INSTITUTION = GATS,
	ADDRESS = GATS_addr,
	MONTH = "July",
	YEAR = 1992,
	ABSTRACT = "TO BE TYPED"
}

@TECHREPORT{linepak,
	AUTHOR = "Marshall, Benjamin T. and Gordley, Larry L. and Chu, D. Allen",
	TITLE = "User Guide to the {GATS} Line by Line Forward Radiance Package ({LINEPAK})",
	INSTITUTION = GATS,
	ADDRESS = GATS_addr,
	MONTH = "November",
	YEAR = 1992,
	ABSTRACT = "TO BE TYPED"
}
